Issue 47, 2015

Exploring the local electronic structure and geometric arrangement of ALD Zn(O,S) buffer layers using X-ray absorption spectroscopy

Abstract

The growing interest in zinc oxysulfide (Zn(O,S)) thin films as buffer layers has been motivated by higher efficiencies achieved in solar cells. In this work we present insights into the electronic-geometric structure relationship of varying compositions of Zn(O,S) grown by atomic layer deposition (ALD). The X-ray absorption near edge structure (XANES), a local bonding-sensitive spectroscopic tool, with quantum simulations helps link the atomic structure to the unoccupied density of states (DOS) of the films. The infiltration of sulfur into a ZnO matrix results in the formation of S 3p–Zn 4sp–O 2p hybridized orbitals in the near edge X-ray absorption fine structure (NEXAFS) region of both the O and S K-edges. The extent of sulfur incorporation affects the ionicity of Zn, which in turn alters the bond lengths of Zn–O within the structure and its resulting bandgap. Knowing Zn(O,S)'s electronic-geometric structure interplay allows one to predict, tailor, and optimize its buffer layer performance.

Graphical abstract: Exploring the local electronic structure and geometric arrangement of ALD Zn(O,S) buffer layers using X-ray absorption spectroscopy

Supplementary files

Article information

Article type
Communication
Submitted
15 Sep 2015
Accepted
05 Nov 2015
First published
06 Nov 2015

J. Mater. Chem. C, 2015,3, 12192-12198

Author version available

Exploring the local electronic structure and geometric arrangement of ALD Zn(O,S) buffer layers using X-ray absorption spectroscopy

A. L. Dadlani, O. Trejo, S. Acharya, J. Torgersen, I. Petousis, D. Nordlund, R. Sarangi, P. Schindler and F. B. Prinz, J. Mater. Chem. C, 2015, 3, 12192 DOI: 10.1039/C5TC02912K

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